CVE-2025-9709

On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.

CVSS

No CVSS.

References

Link	Resource
https://nvd.nist.gov/vuln/detail/CVE-2020-27211
https://raelize.com/upload/research/2022/No_Hat_2022_-_Glitching_devices_for_code_execution_v1.1.pdf
https://raelize.com/upload/research/2025/Dartmouth_202505_False-Injections-Tales-of-Physics-Misconceptions-and-Weird-Machines_v1.1.pdf
https://www.toreon.com/cve-2025-9709-major-vulnerability-in-common-chip/

Configurations

No configuration.

History

05 Sep 2025, 18:15

Type	Values Removed	Values Added
New CVE

Information

Published : 2025-09-05 18:15

Updated : 2025-09-08 16:25

NVD link : CVE-2025-9709

Mitre link : CVE-2025-9709

CVE.ORG link : CVE-2025-9709

JSON object : View

Products Affected

No product.

CWE

CWE-1191

On-Chip Debug and Test Interface With Improper Access Control

CWE-1319

Improper Protection against Electromagnetic Fault Injection (EM-FI)

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